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Подготовка наночастиц для анализа ToF-SIMS и XPS
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Quimica
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JoVE Revista Quimica
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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Подготовка наночастиц для анализа ToF-SIMS и XPS

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06:24 min

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September 13, 2020

DOI:

10.3791/61758-v

DOI:
10.3791/61758-v

•

06:24 min
September 13, 2020

•

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, , , , , , ,
1Division of Surface Analysis and Interfacial Chemistry,Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety,German Federal Institute for Risk Assessment (BfR)

Tags

NanoparticlesSurface AnalysisToF-SIMSXPSSample PreparationSuspensionDrop Dry MethodSpin CoatingPowder DepositionUV Ozone CleanerVacuumSilicon WaferO-ringMicroscopySEM

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Bennet, F., Müller, A., Radnik, J., Hachenberger, Y., Jungnickel, H., Laux, P., Luch, A., Tentschert, J. Preparation of Nanoparticles for ToF-SIMS and XPS Analysis. J. Vis. Exp. (163), e61758, doi:10.3791/61758 (2020).

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