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由 F⁻ 310 Nm 支队所示的阴离子光电子成像

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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

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由 F⁻ 310 Nm 支队所示的阴离子光电子成像

8,479 Views

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06:53 min

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July 27, 2018

DOI:

10.3791/57989-v

DOI:

10.3791/57989-v

•

06:53 min

July 27, 2018

•

1 Views

Justin Lyle¹, Sudharson Ravishankar Chandramoulee¹, C. Annie Hart¹, Richard Mabbs¹

¹Department of Chemistry,Washington University in St. Louis

Summary

在这里, 我们提出了一个关于阴离子物种光电子成像的协议。利用速度映射光电子成像技术, 对真空中产生的阴离子和质谱分离, 提供了负离子和中性能级、负离子和中性结构以及负离子电子态性质的详细资料。

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