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실리콘 링 공진기 광자 소스에서 양자 간섭 측정

JoVE Revista
Ingeniería

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JoVE Revista Ingeniería

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

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실리콘 링 공진기 광자 소스에서 양자 간섭 측정

8,198 Views

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12:19 min

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April 04, 2017

DOI:

10.3791/55257-v

DOI:

10.3791/55257-v

•

12:19 min

April 04, 2017

•

3 Views

Jeffrey A. Steidle¹, Michael L. Fanto^1,2, Stefan F. Preble¹, Christopher C. Tison^2,3,4, Gregory A. Howland², Zihao Wang¹, Paul M. Alsing²

¹Microsystems Engineering,Rochester Institute of Technology, ²Air Force Research Laboratory, Rome, NY, ³Department of Physics,Florida Atlantic University, ⁴Quanterion Solutions Incorporated

Summary

실리콘 광자 칩은 복잡한 통합 양자 시스템을 실현할 수있는 잠재력을 가지고있다. 제조 양자 측정을위한 광 실리콘 칩을 테스트하기위한 방법에 여기에 제시 하였다.

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