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Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials
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Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials

Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials

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10:36 min

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January 21, 2016

DOI:

10.3791/53506-v

DOI:
10.3791/53506-v

•

10:36 min
January 21, 2016

•

2 Views
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1Engineering Physics Division,National Institute of Standards and Technology

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Low-temperature MagnetotransportSingle-layer Thin FilmsNanoelectronicsHeterostructuresGrapheneTransition Metal DichalcogenidesTopological InsulatorsExfoliationSubstrate PreparationAtomic Force MicroscopySputtered Silicon DioxidePDMS-PPC Mechanical StampMicropositioner

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Hagmann, J. A., Le, S. T., Richter, C. A., Seiler, D. G. Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials. J. Vis. Exp. (107), e53506, doi:10.3791/53506 (2016).

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