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Pre-Implantation Genetic Testing for Aneuploidy on a Semiconductor Based Next-Generation Sequencing Platform
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Genetik
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JoVE Journal Genetik
Pre-Implantation Genetic Testing for Aneuploidy on a Semiconductor Based Next-Generation Sequencing Platform

Pre-Implantation Genetic Testing for Aneuploidy on a Semiconductor Based Next-Generation Sequencing Platform

DOI:

09:30 min

August 17, 2022

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Kapitel

  • 00:04Introduction
  • 00:40Fragment Selection Procedure
  • 02:20Sequencing Template Preparation and Enrichment
  • 05:48Loading the Sample and Sequencing
  • 07:22Results: Whole Genome Amplification Combined with Next-Generation Sequencing for Analysis of Embryo Aneuploidy
  • 08:59Conclusion

Summary

Automatische Übersetzung

The protocol presents the overall in-lab procedures required in pre-implantation genetic testing for aneuploidy on a semiconductor-based next-generation sequencing platform. Here we present the detailed steps of whole genome amplification, DNA fragment selection, library construction, template preparation, and sequencing working flow with representative results.

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