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微米/纳米尺度应变分布测量从采样莫尔条纹
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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
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微米/纳米尺度应变分布测量从采样莫尔条纹

12,073 Views

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06:56 min

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May 23, 2017

DOI:

10.3791/55739-v

DOI:
10.3791/55739-v

•

06:56 min
May 23, 2017

•

3 Views
, ,
1Research Institute for Measurement and Analytical Instrumentation,National Institute of Advanced Industrial Science and Technology (AIST)

Summary

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这里介绍了采用2像素和多像素采样方法进行微/纳米级高精度应变分布测量的采样莫尔技术。

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Cite this Article

Wang, Q., Ri, S., Tsuda, H. Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes. J. Vis. Exp. (123), e55739, doi:10.3791/55739 (2017).

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