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07:15 min
June 02, 2017
DOI:
10.3791/55735-v
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Reid, R. C., Piqué, A., Kang, W. A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens. J. Vis. Exp. (124), e55735, doi:10.3791/55735 (2017).
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