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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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JoVE Journal Chemie
In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

DOI:
10.3791/51344-v

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10:22 min

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June 16, 2014

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, ,
1Physical Sciences Division,Pacific Northwest National Laboratory

Kapitel

  • 00:05Titel
  • 02:13Mounting of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions
  • 03:07Soft Landing of Mass-selected Ru(bpy)32+ onto COOH-SAM Surfaces
  • 04:17Analysis by In Situ TOF-SIMS Before and After Exposure to Reactive Gases
  • 05:59Analysis by In Situ FT-ICR-SIMS and IRRAS During and After Soft Landing
  • 07:28Results: Characterization of Organometallic Ions Soft Landed onto COOH-SAMs by In Situ SIMS and IR Spectroscopy
  • 09:39Conclusion

Summary

Automatische Übersetzung

Automatische Übersetzung

Soft landing of mass-selected ions onto surfaces is a powerful approach for the highly-controlled preparation of novel materials. Coupled with analysis by in situ secondary ion mass spectrometry (SIMS) and infrared reflection absorption spectroscopy (IRRAS), soft landing provides unprecedented insights into the interactions of well-defined species with surfaces.

Tags

Soft LandingMass-selected IonsIn Situ CharacterizationSecondary Ion Mass Spectrometry (SIMS)Infrared Reflection Absorption Spectroscopy (IRRAS)OrganometallicsSelf-assembled MonolayersRuthenium Tris(bipyridine) DicationsTime-of-flight (TOF)-SIMSFourier Transform Ion Cyclotron Resonance (FT-ICR)-SIMS

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