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使用200 KV透射电子显微镜常规收集高分辨率冷冻电镜数据集
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March 16, 2022
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Koh, A., Khavnekar, S., Yang, W., Karia, D., Cats, D., van der Ploeg, R., Grollios, F., Raschdorf, O., Kotecha, A., Němeček, D. Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope. J. Vis. Exp. (181), e63519, doi:10.3791/63519 (2022).
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