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化学

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用于ToF-SIMS和XPS分析的纳米颗粒的制备

JoVE 杂志
化学

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JoVE 杂志化学

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

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用于ToF-SIMS和XPS分析的纳米颗粒的制备

DOI:

10.3791/61758-v

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06:24 min

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September 13, 2020

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Francesca Bennet, Anja Müller, Jörg Radnik, Yves Hachenberger, Harald Jungnickel, Peter Laux, Andreas Luch, Jutta Tentschert

¹Division of Surface Analysis and Interfacial Chemistry,Federal Institute for Material Research and Testing (BAM), ²Department of Chemical and Product Safety,German Federal Institute for Risk Assessment (BfR)

Chapters

00:05Introduction
00:45Nanoparticle Suspension Preparation, Drop-Dry Deposition, and Spin Coating Deposition
02:24Nanoparticle Powder Deposition
03:15Nanoparticle Suspension Cryofixation
04:06Results: Representative Nanoparticle Preparation for Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS) Analysis
05:41Conclusion

Summary

自动翻译

介绍了制备用于表面分析的纳米颗粒的多种不同程序（滴铸，旋涂，粉末沉积和冷冻固定）。我们讨论了每种方法的挑战，机遇和可能的应用，特别是关于不同制备方法引起的表面性能变化。

Tags

Nanoparticles Surface Analysis ToF-SIMS XPS Sample Preparation Suspension Drop Dry Method Spin Coating Powder Deposition UV Ozone Cleaner Vacuum Silicon Wafer O-ring Microscopy SEM

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