Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Jeffrey A. Steidle; Michael L. Fanto; Stefan F. Preble; Christopher C. Tison; Gregory A. Howland; Zihao Wang; Paul M. Alsing

doi:10.3791/55257

Journal

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工程学

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Die Messung der Quantum Interference in einem Silizium-Ring-Resonator Photon Source

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Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

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Die Messung der Quantum Interference in einem Silizium-Ring-Resonator Photon Source

8,205 Views

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12:19 min

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April 04, 2017

DOI:

10.3791/55257-v

DOI:

10.3791/55257-v

•

12:19 min

April 04, 2017

•

3 Views

Jeffrey A. Steidle¹, Michael L. Fanto^1,2, Stefan F. Preble¹, Christopher C. Tison^2,3,4, Gregory A. Howland², Zihao Wang¹, Paul M. Alsing²

¹Microsystems Engineering,Rochester Institute of Technology, ²Air Force Research Laboratory, Rome, NY, ³Department of Physics,Florida Atlantic University, ⁴Quanterion Solutions Incorporated

Summary

Silicon photonischer Chips haben das Potenzial, komplexe integrierte Quantensysteme zu realisieren. Vorgestellt ist hier ein Verfahren zur Herstellung und Prüfung eines Silizium-photonischen Chips für Quantenmessungen.

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Die Messung der Quantum Interference in einem Silizium-Ring-Resonator Photon Source

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