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Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
JoVE 杂志
工程学
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JoVE 杂志 工程学
Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

DOI:
10.3791/50129-v

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08:53 min

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October 09, 2012

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, , , , , , , , , ,
1Institute for Solid State Research,IFW-Dresden, 2Institute of Metal Physics of National Academy of Sciences of Ukraine, 3Diamond Light Source LTD, 4Department of Physics,University of Johannesburg, 5CNR-SPIN, and Dipartimento di Fisica “E. R. Caianiello”,Università di Salerno, 6Institute of Physics of Complex Matter,École Polytechnique Fédérale de Lausanne

Chapters

  • 00:05Title
  • 02:18Mounting the Sample
  • 03:01Achieving Ultra-high Vacuum and Thermal Isolation
  • 04:02Positioning and Cooling the Sample
  • 04:55Collecting Data
  • 05:30Results: High Resolution Electronic Structure of Crystals
  • 07:23Conclusion

Summary

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The overall goal of this method is to determine the low-energy electronic structure of solids at ultra-low temperatures using Angle-Resolved Photoemission Spectroscopy with synchrotron radiation.

Tags

Angle-resolved Photoemission SpectroscopyARPESUltra-low TemperatureElectronic StructureMomentumEnergySpectral FunctionPhotoelectric EffectSynchrotron RadiationElectron Energy AnalyzerSr2RuO4

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